Characteristic:

·Can move vertically up and down

·Spring probe with special constant load

·Constant probe spacing

·Can maintain a great degree of repeatability test

·Easy to replace probe

·The z-axis movement can be adjusted at the top of probe table

·The secure connection wire is behind the probe table

Adapter optional: banana/ bnc/ triaxial female

·Chuck can move quickly

·Can be used with heating suction cups

·Pneumatic SR-4 can be controlled by switch

Application:

·Surface resistivity test

·Resistivity test of thin film slice

·The measurement of doping characteristics of semiconductor

·Testing of metal thickness

·Type of semiconductor tested: P type / N type

·Voltage / current test

detailed description:

·Chuck size can be selected: 6 ", 8" and 12 inch; Material Science; Teflon

·Head Up/Down: 16mm

·Probing Z Resolution: 10um

·Probe material: tungsten carbide

·Probe distance: 40mil, 50mil, 62.5mil

·Spring probe force: 45grams, 85grams, 180grams

·Probe diameter: 40.6 microns

·Size: 220mm long x420mm wide x250mm high

·Weight: 20kg