
Name:EB Series Probe Station
Model:
- Introduction
- Related downloads
The EB series is our flagship probe station product line. It’s features and foundation are solid for providing repeatable, accurate measurements in both DC and RF applications. :
Features
Low profile coaxial-driven style stage (optional large knob precision stage)
Back-lash free movement
Mounting for 12 micropositioners
4.5” Probe Card Holder compatible
Micropositioner Standby Dock
Microscope Tilting for E-Z lens switching
Applications
Basic IV/CV
RF, Single Broadband Probing
High Voltage, High Current
Accessories
Hot Chuck with Temperature Controller
Vibration Free Table
Shielding Box
Station Specifications:
Station Footprint 580 mm W x 460 mm D
Station Height 450 mm (to Platen)/700 mm (to Microscope)
Station Weight 60kg
Platen Material Hard Chrome Plated Steel
Platen Dimension 250 mm Inner, 450mm Outer
Platen Capacity 12 DC or 4 RF 4 DC
Positioner Mount Magnetic ON/OFF Switch
No. of Vacuum Switches 4
Chuck Material Stainless Steel
Chuck Stage Type Coaxial (Large Knob Optional)
Chuck Travel Range 6” x 6”
Chuck Quick Resolution 25 mm/rev
Chuck Fine Resolution 1 μm
Chuck Theta Coarse Travel 360˚
Chuck Theta Fine Resolution 0.01˚
Chuck Z-Motion 4 mm Range
Chuck Z Fine Resolution 1 μm
Coaxial Chuck Movement Bevelled Gear and Rack 0.8mm Pitch
Large Knob Chuck Movement High Precision Linear Stage
Chuck Size 4”, 6”, 8”, 10”, 12”
Chuck Planarity 3 μm
Chuck Rigidity 15 μm / 10 N @ edge
Chuck Vacuum Grooves Center, 1.5”, 3” ,5” (Individually Controlled)
Chuck Bias Capacity Up to 2 kV
Chuck Isolation 5 GΩ
DUT Size Range 2 mm - 150 mm
Microscope Stage Travel Range 2” x 2”
Microscope Zoom Range 1x - 5x
Microscope Eye Piece 20x
Microscope Magnification Range 20x-100x